Chinese Journal of Lasers, Volume. 29, Issue s1, 503(2002)

Influence of D. C. Reactive Magnetron Sputtering Conditions on the Preferred Orientation and N/Ti Ratio of TiN Films Coated on Glass

ZHAO Qing-nan1,2 and ZHAO Xiu-jian1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    References(4)

    [1] [1] I. Milosev, Η. Η. Strehblow, Β. Navinsek. XPS in the study of high-temperature oxidation of CrN and TiN hard coatings. Surface and Coatings Technology, 1995, 74~75:396~399

    [2] [2] Meng Lijian, M. P. S. Dos. Characterization of titanium nitride films prepared by d. c. reactive magnetron sputtering at different nitrogen pressures. Surface and Coatings Technology, 1997, 90:64—70

    [3] [3] C. Mitterer, P. H. Mayrhofer, W. Waldhauser et al.. The influence of the ion bombardment on the optical properties of TiN and ZrN coatings. Surface and Coatings Technology, 1998, 108~109:230~235

    [4] [4] Μ. H. Kazemeini, A. A. Berezin, N. Fukuhara. Formation of thin TiNO films by using a hollow cathode reactive DC sputtering system. Thin Solid Films, 2000, 372:70-77

    CLP Journals

    [1] Liu Yao, Bai Fuzhong, Wu Yaqin, Gan Shiming, Liu Zhen, Bao Xiaoyan. A Common-Path Radial Shearing Phase-Shifting Interferometer with Adjustable Fringe Contrast[J]. Acta Optica Sinica, 2013, 33(6): 622003

    [2] Dong Zheliang, Feng Guoying, Hu Lili, Zhang Shulin. Measure the Complex Amplitude of Laser Mode by Mach-Zehnder Point Diffraction Interferometer[J]. Chinese Journal of Lasers, 2015, 42(7): 708008

    Tools

    Get Citation

    Copy Citation Text

    ZHAO Qing-nan, ZHAO Xiu-jian. Influence of D. C. Reactive Magnetron Sputtering Conditions on the Preferred Orientation and N/Ti Ratio of TiN Films Coated on Glass[J]. Chinese Journal of Lasers, 2002, 29(s1): 503

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: laser devices and laser physics

    Received: --

    Accepted: --

    Published Online: Feb. 23, 2013

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics