Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Opto-Electronic Engineering, Volume. 35, Issue 7, 84(2008)

Profilometer Based on Interferometry and Micro Vision System

WANG Hai-shan1,2、*, SHI Tie-lin1,2, LIAO Guang-lan1,2, LIU Shi-yuan1,2, and ZHANG Wen-dong3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
    • show less
    AbstractGet PDF
    Figures&Tables (0)
    Equations (0)
    References (3)
    Tools
    Paper Information
    Topics
    References(3)

    [4] [4] Akira HIRABAYASHI,Hidemitsu OGAWA,Katsuichi KITAGAWA.Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory[J].Applied Optics,2002,41(23):4876-4883

    [6] [6] Michael B SINCLAIR,Maarten P DE BOER,Alex D CORWIN.Long-working-distance incoherent-light interference microscope[J].Applied Optics,2005,44(36):7714-7721

    [7] [7] Michael W LINDNER.White-light interferometry via an endoscope[J].SPIE,2002,4777:90-101

    Tools

    Get Citation

    Copy Citation Text

    WANG Hai-shan, SHI Tie-lin, LIAO Guang-lan, LIU Shi-yuan, ZHANG Wen-dong. Profilometer Based on Interferometry and Micro Vision System[J]. Opto-Electronic Engineering, 2008, 35(7): 84

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category:

    Received: Oct. 11, 2007

    Accepted: --

    Published Online: Mar. 1, 2010

    The Author Email: Hai-shan WANG (tomcatttt@163.com)

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology