Opto-Electronic Engineering, Volume. 35, Issue 7, 84(2008)
Profilometer Based on Interferometry and Micro Vision System
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WANG Hai-shan, SHI Tie-lin, LIAO Guang-lan, LIU Shi-yuan, ZHANG Wen-dong. Profilometer Based on Interferometry and Micro Vision System[J]. Opto-Electronic Engineering, 2008, 35(7): 84
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Received: Oct. 11, 2007
Accepted: --
Published Online: Mar. 1, 2010
The Author Email: Hai-shan WANG (tomcatttt@163.com)
CSTR:32186.14.
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