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Chinese Journal of Lasers, Volume. 40, Issue 12, 1217001(2013)

Study on Resolution Limit of Total-Reflection X-Ray Optics with Heisenberg Uncertainty Principle

Sun Tianxi1,2,3、*, Liu Zhiguo1,2,3, Peng Song1,2,3, Sun Weiyuan1,2,3, and Ding Xunliang1,2,3
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    Sun Tianxi, Liu Zhiguo, Peng Song, Sun Weiyuan, Ding Xunliang. Study on Resolution Limit of Total-Reflection X-Ray Optics with Heisenberg Uncertainty Principle[J]. Chinese Journal of Lasers, 2013, 40(12): 1217001

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    Received: Jul. 2, 2013

    Accepted: --

    Published Online: Dec. 5, 2013

    The Author Email: Tianxi Sun (stx@bnu.edu.cn)

    DOI:10.3788/cjl201340.1217001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology