Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Chinese Journal of Lasers, Volume. 40, Issue 12, 1217001(2013)

Study on Resolution Limit of Total-Reflection X-Ray Optics with Heisenberg Uncertainty Principle

Sun Tianxi1,2,3、*, Liu Zhiguo1,2,3, Peng Song1,2,3, Sun Weiyuan1,2,3, and Ding Xunliang1,2,3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (20)
    Cited By (2)
    Tools
    Paper Information
    Topics
    Cited By

    Article index updated: Mar. 10, 2025

    The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)
    Tools

    Get Citation

    Copy Citation Text

    Sun Tianxi, Liu Zhiguo, Peng Song, Sun Weiyuan, Ding Xunliang. Study on Resolution Limit of Total-Reflection X-Ray Optics with Heisenberg Uncertainty Principle[J]. Chinese Journal of Lasers, 2013, 40(12): 1217001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category:

    Received: Jul. 2, 2013

    Accepted: --

    Published Online: Dec. 5, 2013

    The Author Email: Tianxi Sun (stx@bnu.edu.cn)

    DOI:10.3788/cjl201340.1217001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology