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Chinese Journal of Lasers, Volume. 13, Issue 5, 284(1986)

A comprehensive measurement method of parameters for semiconductor lasers and its application

Xiao Zongyao, Chen Lianyong, and Xin Huifang
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    [1] [1] B. A. Linke et al.; Optical Fiber Communication Technical Digest, 1984, New Orleans, Louisiana, Paper, WJ7.

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    Xiao Zongyao, Chen Lianyong, Xin Huifang. A comprehensive measurement method of parameters for semiconductor lasers and its application[J]. Chinese Journal of Lasers, 1986, 13(5): 284

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    Paper Information

    Category: laser devices and laser physics

    Received: Aug. 6, 1984

    Accepted: --

    Published Online: Aug. 2, 2012

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology