Chinese Journal of Lasers, Volume. 13, Issue 5, 284(1986)
A comprehensive measurement method of parameters for semiconductor lasers and its application
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Xiao Zongyao, Chen Lianyong, Xin Huifang. A comprehensive measurement method of parameters for semiconductor lasers and its application[J]. Chinese Journal of Lasers, 1986, 13(5): 284
Paper Information
Category: laser devices and laser physics
Received: Aug. 6, 1984
Accepted: --
Published Online: Aug. 2, 2012
The Author Email:
CSTR:32186.14.
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