Microelectronics, Volume. 55, Issue 1, 114(2025)

A NS SAR ADC with kT/C Noise Cancellation and Mismatch Error Shaping

FU Jianjun1,2, YI Tiange3, LIU Jiaxin3, and JIANG Hequan2
Author Affiliations
  • 1China Key System & Integrated Circuit Co., Ltd, Wuxi, Jiangsu 214072 P. R. China
  • 2State Key Laboratory of Intelligent Vehicle Safety Technology, Chongqing 401133 P. R. China
  • 3University of Electronic Science and Technology of China, Chengdu 611731, P. R. China
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    FU Jianjun, YI Tiange, LIU Jiaxin, JIANG Hequan. A NS SAR ADC with kT/C Noise Cancellation and Mismatch Error Shaping[J]. Microelectronics, 2025, 55(1): 114

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Oct. 9, 2024

    Accepted: Jun. 19, 2025

    Published Online: Jun. 19, 2025

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.240354

    Topics