Microelectronics, Volume. 55, Issue 1, 114(2025)

A NS SAR ADC with kT/C Noise Cancellation and Mismatch Error Shaping

FU Jianjun1,2, YI Tiange3, LIU Jiaxin3, and JIANG Hequan2
Author Affiliations
  • 1China Key System & Integrated Circuit Co., Ltd, Wuxi, Jiangsu 214072 P. R. China
  • 2State Key Laboratory of Intelligent Vehicle Safety Technology, Chongqing 401133 P. R. China
  • 3University of Electronic Science and Technology of China, Chengdu 611731, P. R. China
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    The effective resolution of successive-approximation (SAR) analog-to-digital converters (ADCs) is primarily limited by sampling noise, analog-to-digital converter (DAC) mismatch, and comparator noise. This work presents a noise-shaping SAR ADC design that addresses all of these error sources. Sampling noise is mitigated using a kT/C noise cancellation technique combined with resampling. DAC mismatch is managed through data-weighted averaging (DWA) and mismatch error shaping (MES), while comparator noise is reduced using a second-order passive noise-shaping (NS) technique. Designed in a 40 nm CMOS process, the simulation results show that the ADC achieves an 86.8 dB signal-to-noise and distortion ratio (SNDR) across a 2.8 MHz bandwidth with a power consumption of 3.8 mW.

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    FU Jianjun, YI Tiange, LIU Jiaxin, JIANG Hequan. A NS SAR ADC with kT/C Noise Cancellation and Mismatch Error Shaping[J]. Microelectronics, 2025, 55(1): 114

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    Paper Information

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    Received: Oct. 9, 2024

    Accepted: Jun. 19, 2025

    Published Online: Jun. 19, 2025

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.240354

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