Embedding epitaxial VO<sub>2</sub> film with quality metal-insulator transition to SAW devices

M. E. Kutepov; G. Ya. Karapetyan; T. A. Minasyan; V. E. Kaydashev; I. V. Lisnevskaya; K. G. Abdulvakhidov; A. A. Kozmin; E. M. Kaidashev

doi:10.1142/S2010135X22500187

Journal of Advanced Dielectrics, Volume. 12, Issue 5, 2250018(2022)

Embedding epitaxial VO₂ film with quality metal-insulator transition to SAW devices

M. E. Kutepov^1、*, G. Ya. Karapetyan¹, T. A. Minasyan¹, V. E. Kaydashev¹, I. V. Lisnevskaya², K. G. Abdulvakhidov³, A. A. Kozmin¹, and E. M. Kaidashev¹

Author Affiliations

¹Laboratory of Nanomaterials, Southern Federal University, 200/1 Stachki Ave., 344090 Rostov-on-Don, Russia

²Department of Chemistry, Southern Federal University, 7 Zorge St., 344090 Rostov-on-Don, Russia

³Smart Materials Research Institute, Southern Federal University, 178/24 Sladkova St., 344090 Rostov-on-Don, Russia

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M. E. Kutepov, G. Ya. Karapetyan, T. A. Minasyan, V. E. Kaydashev, I. V. Lisnevskaya, K. G. Abdulvakhidov, A. A. Kozmin, E. M. Kaidashev. Embedding epitaxial VO₂ film with quality metal-insulator transition to SAW devices[J]. Journal of Advanced Dielectrics, 2022, 12(5): 2250018

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Paper Information

Category: Research Articles

Received: Jun. 24, 2022

Accepted: Sep. 15, 2022

Published Online: Dec. 5, 2022

The Author Email: M. E. Kutepov (kutepov.max@yandex.ru)

DOI:10.1142/S2010135X22500187

CSTR:32405.14.S2010135X22500187

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology