Opto-Electronic Engineering, Volume. 48, Issue 6, 200463(2021)

Analysis of temperature-induced liquid crystal phase control beam quality deterioration

Huang Fan1, Wang Xiangru1、*, He Xiaoxian1, Zhang Mengxue1, Wang Yingli1, Guo Hongyang2, Hu Jie2, and Ma Haotong2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    Huang Fan, Wang Xiangru, He Xiaoxian, Zhang Mengxue, Wang Yingli, Guo Hongyang, Hu Jie, Ma Haotong. Analysis of temperature-induced liquid crystal phase control beam quality deterioration[J]. Opto-Electronic Engineering, 2021, 48(6): 200463

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    Paper Information

    Category: Article

    Received: Dec. 16, 2020

    Accepted: --

    Published Online: Sep. 4, 2021

    The Author Email: Xiangru Wang (xiangruwang@uestc.edu.cn)

    DOI:10.12086/oee.2021.200463

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