Opto-Electronic Engineering, Volume. 48, Issue 6, 200463(2021)
Analysis of temperature-induced liquid crystal phase control beam quality deterioration
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Huang Fan, Wang Xiangru, He Xiaoxian, Zhang Mengxue, Wang Yingli, Guo Hongyang, Hu Jie, Ma Haotong. Analysis of temperature-induced liquid crystal phase control beam quality deterioration[J]. Opto-Electronic Engineering, 2021, 48(6): 200463
Paper Information
Category: Article
Received: Dec. 16, 2020
Accepted: --
Published Online: Sep. 4, 2021
The Author Email: Xiangru Wang (xiangruwang@uestc.edu.cn)
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