Journal of Applied Optics, Volume. 43, Issue 6, 1181(2022)

Degassing method of electronic sensitive CMOS components

Tongtong LI1,2、*, Chao XIAO1,2, Gangcheng JIAO1,2, Lei YAN1,2, Haibo FAN1,2, Jing MA1,2, and Chenglin LI1,2
Author Affiliations
  • 1Science and Technology on Low-Light-Level Night Vision Laboratory, Xi'an 710065, China
  • 2Kunming Institute of Physics, Kunming 650223, China
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    Figures & Tables(5)
    Structure diagram of EBAPS device
    Schematic diagram of degassing system for electronic sensitive CMOS component
    Mass spectrum peak distribution before experiment
    Changes of ion flow of four gases at different drying temperatures
    Changes of ion flow of four gases baked at 260 ℃ for 3 days
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    Tongtong LI, Chao XIAO, Gangcheng JIAO, Lei YAN, Haibo FAN, Jing MA, Chenglin LI. Degassing method of electronic sensitive CMOS components[J]. Journal of Applied Optics, 2022, 43(6): 1181

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    Paper Information

    Category: Research Articles

    Received: Sep. 4, 2022

    Accepted: --

    Published Online: Nov. 18, 2022

    The Author Email:

    DOI:10.5768/JAO202243.0604019

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