Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Chinese Journal of Lasers, Volume. 41, Issue 5, 502001(2014)

Accelerated Life Testing Model of Laser Diodes under Space Radiation Stress

Liu Yun1、*, Zhao Shanghong1, Yang Shengsheng2, Li Yongjun1, and Qiang Ruoxin1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (23)
    Cited By (1)
    Tools
    Paper Information
    Topics
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    Liu Yun, Zhao Shanghong, Yang Shengsheng, Li Yongjun, Qiang Ruoxin. Accelerated Life Testing Model of Laser Diodes under Space Radiation Stress[J]. Chinese Journal of Lasers, 2014, 41(5): 502001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category: Laser physics

    Received: Nov. 4, 2013

    Accepted: --

    Published Online: Apr. 18, 2014

    The Author Email: Liu Yun (ikmnji@126.com)

    DOI:10.3788/cjl201441.0502001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology