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Chinese Journal of Lasers, Volume. 41, Issue 5, 502001(2014)

Accelerated Life Testing Model of Laser Diodes under Space Radiation Stress

Liu Yun1、*, Zhao Shanghong1, Yang Shengsheng2, Li Yongjun1, and Qiang Ruoxin1
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    Liu Yun, Zhao Shanghong, Yang Shengsheng, Li Yongjun, Qiang Ruoxin. Accelerated Life Testing Model of Laser Diodes under Space Radiation Stress[J]. Chinese Journal of Lasers, 2014, 41(5): 502001

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    Paper Information

    Category: Laser physics

    Received: Nov. 4, 2013

    Accepted: --

    Published Online: Apr. 18, 2014

    The Author Email: Liu Yun (ikmnji@126.com)

    DOI:10.3788/cjl201441.0502001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology