Researching | Absorption measurement of optical thin films under high power density with a Closed Cavity

Chinese Optics Letters, Volume. 13, Issue 3, 033101(2015)

Absorption measurement of optical thin films under high power density with a Closed Cavity

Xiaoting Fang, Shengfu Yuan^*, Wenguang Liu, Baozhu Yan, and Bing Huang

Author Affiliations

College of Optoelectric Science and Engineering, National University of Defence Technology, Changsha 410073, China

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References(11)

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Cited By

[1] Zhaokai Lou, Kai Han, Chaofan Zhang, Minsun Chen, Baozhu Yan, Yi Yang, Hao Liu, Jian Chen, Xiao Li. The characterization of laser-induced thermal damage mechanism of mid-infrared optical coatings with surface contaminants. Physica Scripta, 95, 035507(2020).

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Xiaoting Fang, Shengfu Yuan, Wenguang Liu, Baozhu Yan, Bing Huang, "Absorption measurement of optical thin films under high power density with a Closed Cavity," Chin. Opt. Lett. 13, 033101 (2015)

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Paper Information

Category: Thin films

Received: Sep. 4, 2014

Accepted: Jan. 16, 2015

Published Online: Sep. 25, 2018

The Author Email: Shengfu Yuan (shengfuyuan_bb@163.com)

DOI:10.3788/COL201513.033101

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology