Infrared Technology, Volume. 46, Issue 8, 965(2024)
Optical Constants and Thickness Testing of Films Based on Reflection Spectroscopy
References(2)
[8] [8] Jakopic G, Par G, Papoueek W.Unified analytical inversion of reflectometric and ellipsometric data of absorbing media[J]. Appl. Opt., 2000, 39(16): 2727-2732．
[15] [15] Laaziza Y, Bennouna A, Chadburn N. Optical characterization of low optical thickness thin films from transmittance and back reflectance measurements[J]. Thin Solid Films, 2000, 372: 149-155.
Tools
Get Citation
Copy Citation Text
LYU Yonglin, ZHENG Wanxiang, LI Rujie, ZHANG Youliang, TANG Yingjuan, ZHANG Weitao, CHEN Yijun, WANG Guiquan, LI Yansheng, WANG Qiaofang. Optical Constants and Thickness Testing of Films Based on Reflection Spectroscopy[J]. Infrared Technology, 2024, 46(8): 965
Paper Information
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20