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Infrared Technology, Volume. 46, Issue 8, 965(2024)

Optical Constants and Thickness Testing of Films Based on Reflection Spectroscopy

Yonglin LYU1, Wanxiang ZHENG2、*, Rujie LI3, Youliang ZHANG2, Yingjuan TANG2, Weitao ZHANG2, Yijun CHEN4, Guiquan WANG4, Yansheng LI4, and Qiaofang WANG2
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    LYU Yonglin, ZHENG Wanxiang, LI Rujie, ZHANG Youliang, TANG Yingjuan, ZHANG Weitao, CHEN Yijun, WANG Guiquan, LI Yansheng, WANG Qiaofang. Optical Constants and Thickness Testing of Films Based on Reflection Spectroscopy[J]. Infrared Technology, 2024, 46(8): 965

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    Received: Jan. 10, 2024

    Accepted: --

    Published Online: Sep. 10, 2024

    The Author Email: Wanxiang ZHENG (1138319556@qq.com。)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology