Photonics Research, Volume. 10, Issue 9, 2147(2022)
Dynamic nitrogen vacancy magnetometry by single-shot optical streaking microscopy
Fig. 1. Intensity map (A) at the sample plane of a collection optic (B) is imaged to a narrow spatial mask (C) at the primary image plane. Individual colors indicate time steps. The mask constrains a single spatial dimension before the reduced intensity map is re-imaged to a detector by a 4f telescope (D). A galvo-scanner (E) at the telescope’s Fourier plane provides a constant velocity streaking operator, separating temporal information as a function of spatial position. The reduced and streaked scene is then imaged to the camera sensor (F) by the second
Fig. 2. NV optical streaking magnetometer designed around a widefield fluorescence microscope is depicted. A 532 nm laser (green) was focused to the back focal plane of a long working distance objective (OBJ) by a plano–convex lens (L1). NV fluorescence (red) was separated from the source by a dichroic mirror (DM) and a long-pass filter LPF. The NV diamond sensor (NVD) was mounted on a printed circuit board with a co-planar microstrip RF antenna loop (RFA). An optical window at the center of the RF antenna allowed for illumination and fluorescence collection. A field coil (FC) was centered on the NV sensor such that spatially uniform magnetic fields could be generated. Spatially varying magnetic fields were generated with a permalloy electromagnetic needle (EM) wrapped with a coil fixed to a rotational mount. To reduce the amount of overlap between adjacent time steps, a mechanical slit (MS) was positioned at the primary image plane formed by the tube lens (L2). Optical streaking was achieved with a galvo-scanner (GS) positioned at the Fourier plane of a 4f telescope (L3 and L4) coupling the primary image plane to the detector (CMOS). Cylindrical beams and conic focal points are depicted to differentiate between infinity space and image planes, respectively. Components were not drawn to scale to assist with visibility of the optical path.
Fig. 3. (Left) Simplified block diagram demonstrating the streak control system. A PC data acquisition card provided the TTL signal to start the PGEN and serial communications with the RF generator. System timing was provided by a digital PGEN through TTL signals sent to trigger the camera and a function generator. Magnetic field and ramp voltages were output from the function generator to the magnetic field coil and galvo-scanner, respectively. Continuous RF was amplified before being coupled to the NV diamond by a coplanar microstrip antenna loop. (Right) The optical streak system timing diagram is shown for a single acquisition period
Fig. 4. Optimization and magnetic sensitivity analysis to demonstrate proper NV function as a magnetometer during optical streaking. (A) ODMR plot of the average intensity across each streak as a function of RF from 2830 to 2910 MHz acquired with an
Fig. 5. Demonstration of magnetic field intensity plots obtained by optically streaking an electromagnetic needle moving laterally across the NV diamond sensor and validation of needle size. (A) A 50% transparent image of a 1951 USAF resolution test target was registered with an image of the needle such that the tip was adjacent to the horizontal bars of group 3 element 3 with a known width of 49.61 μm. (B) Magnetic field profile near the electromagnet imaged with the slit open and the needle stationary quantified by the change in fluorescence contrast from the background streak. A vertical dashed yellow line indicates the slice of the image captured by the narrow slit. The magnetic field intensity drops off sharply as the sharpened tip of the electromagnet recedes from the NV sensor that supports the
Get Citation
Copy Citation Text
Mark A. Keppler, Zachary A. Steelman, Zachary N. Coker, Miloš Nesládek, Philip R. Hemmer, Vladislav V. Yakovlev, Joel N. Bixler, "Dynamic nitrogen vacancy magnetometry by single-shot optical streaking microscopy," Photonics Res. 10, 2147 (2022)
Category: Imaging Systems, Microscopy, and Displays
Received: Feb. 7, 2022
Accepted: Jun. 15, 2022
Published Online: Aug. 29, 2022
The Author Email: Mark A. Keppler (keppler.mark@gmail.com)