Journal of Infrared and Millimeter Waves, Volume. 40, Issue 2, 161(2021)

A convolution approach for the epilayer thickness in liquid phase epitaxial growth

Yan-Feng WEI* and Quan-Zhi SUN
Author Affiliations
  • Key Laboratory of infrared imaging materials and detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
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    References(15)

    [8] Small M B, Crossley I. The physical processes occurring during liquid phase epitaxial growth[J]. J. Crystal Growth, 27, 35-48(1974).

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    Yan-Feng WEI, Quan-Zhi SUN. A convolution approach for the epilayer thickness in liquid phase epitaxial growth[J]. Journal of Infrared and Millimeter Waves, 2021, 40(2): 161

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    Paper Information

    Category: Research Articles

    Received: May. 28, 2020

    Accepted: --

    Published Online: Aug. 31, 2021

    The Author Email: Yan-Feng WEI (yfwei@mail.sitp.ac.cn)

    DOI:10.11972/j.issn.1001-9014.2021.02.004

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