Acta Optica Sinica, Volume. 45, Issue 1, 0112003(2025)

Dual‐Mode Quantitative Phase Imaging Based on Mach‐Zehnder Point Diffraction

Zhengqiong Dong1, Jingyi Wang1, Yijun Xie1, Zedi Li2, Renlong Zhu1, Lei Nie1、*, and Jinlong Zhu2
Author Affiliations
  • 1Hubei Key Laboratory of Modern Manufacturing Quality Engineering, Hubei University of Technology, Wuhan 430068, Hubei , China
  • 2State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, Hubei , China
  • show less
    References(28)

    [2] Li C H, Cui S W, Yao X T. Application of quantitative phase imaging in ultrafast laser processing inspection[J]. Chinese Journal of Lasers, 50, 1202403(2023).

    [9] Kim M K. Principles and techniques of digital holographic microscopy[J]. SPIE Reviews, 1, 018005(2010).

    [11] Yang C Y, Wang J, Zhang C et al. Observation method of microphysical parameters of ice crystals in cloud based on digital holography[J]. Acta Optica Sinica, 44, 0601017(2024).

    [13] Li W X, Huang S J, Yan C. Morphology measurement of glass micromachining based on digital holography[J]. Acta Photonica Sinica, 50, 0912003(2021).

    [18] Jin C. Research on micro-nano structure measurement based on digital holography and its key technologies[D](2022).

    [25] Zhong L Y, Zhang Y M, Lü X X et al. Analysis of some fundamental issue about digital hologram[J]. Acta Optica Sinica, 24, 465-471(2004).

    [26] Shi S F. Theoretical and experimental study on the influence of batwing effect on the three-dimensional resolution of white light interference microscopy[D](2019).

    Tools

    Get Citation

    Copy Citation Text

    Zhengqiong Dong, Jingyi Wang, Yijun Xie, Zedi Li, Renlong Zhu, Lei Nie, Jinlong Zhu. Dual‐Mode Quantitative Phase Imaging Based on Mach‐Zehnder Point Diffraction[J]. Acta Optica Sinica, 2025, 45(1): 0112003

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 8, 2024

    Accepted: Sep. 25, 2024

    Published Online: Jan. 20, 2025

    The Author Email: Nie Lei (leinie@hbut.edu.cn)

    DOI:10.3788/AOS241412

    Topics