Infrared and Laser Engineering, Volume. 44, Issue 10, 2938(2015)
Temperature stress reliability testing system for infrared aiming device
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Liu Ming, Li Danni, Zhang Guoyu, Sun Xiangyang, Zhao Zhao, Duan Jie. Temperature stress reliability testing system for infrared aiming device[J]. Infrared and Laser Engineering, 2015, 44(10): 2938
Category: 光电测量
Received: Feb. 4, 2015
Accepted: Mar. 10, 2015
Published Online: Jan. 26, 2016
The Author Email: Ming Liu (liuming2525775@126.com)
CSTR:32186.14.