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Infrared and Laser Engineering, Volume. 44, Issue 10, 2938(2015)

Temperature stress reliability testing system for infrared aiming device

Liu Ming1、*, Li Danni1, Zhang Guoyu1, Sun Xiangyang2, Zhao Zhao3, and Duan Jie1
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    Liu Ming, Li Danni, Zhang Guoyu, Sun Xiangyang, Zhao Zhao, Duan Jie. Temperature stress reliability testing system for infrared aiming device[J]. Infrared and Laser Engineering, 2015, 44(10): 2938

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    Paper Information

    Category: 光电测量

    Received: Feb. 4, 2015

    Accepted: Mar. 10, 2015

    Published Online: Jan. 26, 2016

    The Author Email: Ming Liu (liuming2525775@126.com)

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology