<trans-title xml:lang="en">Effect of V<sup>5+</sup> Substitution on Microstructure and Microwave Dielectric Properties of LaTaO<sub>4</sub> Ceramics </trans-title>

Wenyuan LI; Jianan XU; Han'ao DENG; Aimin CHANG; Bo ZHANG

doi:10.15541/jim20240482

Journal of Inorganic Materials, Volume. 40, Issue 6, 697(2025)

Effect of V⁵⁺ Substitution on Microstructure and Microwave Dielectric Properties of LaTaO₄ Ceramics

Wenyuan LI^1,2, Jianan XU^1,2, Han'ao DENG¹, Aimin CHANG¹, and Bo ZHANG^1、*

¹1. State Key Laboratory of Functional Materials and Devices for Special Environmental Conditions, Xinjiang Key Laboratory of Electronic Information Materials and Devices, Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China

²2. Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

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Figures & Tables(6)

1. XRD patterns (a) and Rietveld refinement XRD patterns (b-f) of LTV-x ceramics sintered at 1400 ℃ for 4 h

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2. SEM images of LTV-x ceramics and EDS mappings of area A

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3. TEM and HRTEM characterizations of LTV-0.3 ceramics

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4. Apparent densities of LTV-x ceramics sintered at different temperatures and relative densities of ceramics sintered at 1400 ℃

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5. Microwave dielectric properties of LTV-x ceramics sintered at 1400 ℃

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Table 1. Lattice parameters and reliable factors of LTV-x ceramics obtained by the Rietveld profile refinement method

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Table 1. Lattice parameters and reliable factors of LTV-x ceramics obtained by the Rietveld profile refinement method

x	Atom	Atom position			Mult	Occupancy	Refining reliability factor		Volume/Å³
x	Atom	x	y	z	Mult	Occupancy	R_wp/%	R_p/%	Volume/Å³
0	La1	0.0000	0.6292	0.2500	4	1.0000	8.45	6.18	326.04
	Ta1	0.0000	0.1036	0.2500	4	1.0000
	O1	0.1460	0.2042	0.1572	8	1.0000
	O2	0.2624	0.4663	0.3170	8	1.0000
0.1	La1	0.0000	0.6292	0.2500	4	1.0000	7.54	5.71	325.41
	Ta1	0.0000	0.1036	0.2500	4	0.9000
	V1	0.0000	0.1036	0.2500	4	0.1000
	O1	0.1460	0.2042	0.1572	8	1.0000
	O2	0.2624	0.4663	0.3170	8	1.0000
0.2	La1	0.0000	0.6292	0.2500	4	1.0000	8.62	6.42	324.98
	Ta1	0.0000	0.1036	0.2500	4	0.8000
	V1	0.0000	0.1036	0.2500	4	0.2000
	O1	0.1460	0.2042	0.1572	8	1.0000
	O2	0.2624	0.4663	0.3170	8	1.0000
0.3	La1	0.0000	0.6292	0.2500	4	1.0000	7.39	5.97	323.85
	Ta1	0.0000	0.1036	0.2500	4	0.7000
	V1	0.0000	0.1036	0.2500	4	0.3000
	O1	0.1460	0.2042	0.1572	8	1.0000
	O2	0.2624	0.4663	0.3170	8	1.0000
0.4	La1	0.0000	0.6292	0.2500	4	1.0000	9.27	7.24	323.61
	Ta1	0.0000	0.1036	0.2500	4	0.6000
	V1	0.0000	0.1036	0.2500	4	0.4000
	O1	0.1460	0.2042	0.1572	8	1.0000
	O2	0.2624	0.4663	0.3170	8	1.0000

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Wenyuan LI, Jianan XU, Han'ao DENG, Aimin CHANG, Bo ZHANG. Effect of V⁵⁺ Substitution on Microstructure and Microwave Dielectric Properties of LaTaO₄ Ceramics [J]. Journal of Inorganic Materials, 2025, 40(6): 697

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Paper Information

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Received: Nov. 13, 2024

Accepted: --

Published Online: Sep. 2, 2025

The Author Email: Bo ZHANG (zhangbocas@ms.xjb.ac.cn)

DOI:10.15541/jim20240482

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology