[1] Zhang X X, Ning T L, Liu L H et al. Influence of fast axis angle of wave plate on accuracy of spatially modulated polarization measurements[J]. Acta Optica Sinica, 44, 1612003(2024).

[2] Chen Q H, Shao D, Liu F M et al. Double-resolution wave plate measurement based on equivalent components and phase compensation[J]. Chinese Journal of Lasers, 51, 0804004(2024).

[3] Sun J H, Li J N, Liu Y Q et al. A flexible U-shaped metamaterial terahertz quarter-wave plate with corner design[J]. Optics & Laser Technology, 175, 110834(2024).

[4] Wang J, Wu A H, Deng Y. Stability optimization of laser feedback birefringence measurement system[J]. Laser & Optoelectronics Progress, 60, 1712004(2023).

[5] Bakhouche B, Beniaiche A, Guessas H. Novel method for determining the fast axis and phase retardation of a wave plate using Fresnel Rhomb[J]. Journal of Modern Optics, 64, 238-243(2017).

[6] Liu J, You K, Zhao Q L et al. Measuring phase retardation of wave plate based on normalized polarization modulation and error analysis[J]. Optik, 157, 798-803(2018).

[7] Wang S, Han X, Wang Y N et al. Dispersion of the retardation of a photoelastic modulator[J]. Applied Sciences, 9, 341(2019).

[8] Li K W, Qiu Y F, Cui Z Y et al. Measurement of two-dimensional distribution of stress birefringence based on dual photoelastic modulators cascade difference frequency modulation[J]. Optics and Precision Engineering, 31, 2647-2655(2023).

[9] Bashar F, Kurtz J B, Alenin A S et al. Improving performance of PEM-based partial Mueller matrix polarimeters[J]. Proceedings of SPIE, 11132, 111320I(2019).

[10] Chen W X, Zhang S L, Long X W. Thickness and refractive-index measurement of birefringent material by laser feedback technique[J]. Optics Letters, 38, 998-1000(2013).

[11] Zhang S L, Tan Y D, Li Y. Orthogonally polarized dual frequency lasers and applications in self-sensing metrology[J]. Measurement Science and Technology, 21, 054016(2010).

[12] Liu W X, Wei Z W, Zhao W Q et al. Design of phase retardation measuring instrument for optical wave plate[J]. Infrared and Laser Engineering, 48, 0718001(2019).

[14] Chen Q H, Guan Y, Zhou S et al. High-accuracy wave plate measurement based on dual-frequency laser interferometry and phase detection[J]. Acta Optica Sinica, 43, 0112002(2023).

[15] Bhaduri B, Mohan N K, Kothiyal M P et al. Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)[J]. Optics Express, 14, 11598-11607(2006).

[16] Kliger S, Lewis J W, Randall C E[M]. Polarized light in optics and spectroscopy, 39-52(1990).

[17] Cao Q Z, Yuan C A, Hu B Q et al. Principle analysis of snapshot Mueller matrix imaging polarimeter using birefringent crystal[J]. Acta Physica Sinica, 67, 104209(2018).

[18] Zhao Q H. Research on key technology of multiplexed measurement in spatial carrier speckle pattern interferometry[D](2021).

[19] Yang L X, Steinchen W, Schuth M et al. Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry[J]. Measurement, 16, 149-160(1995).

[20] Park H, Jeong S, Seo C et al. Electrically tunable THz graphene metasurface wave retarders[J]. Nanophotonics, 12, 2553-2562(2023).

[21] Turnbull D, Michel P, Chapman T et al. High power dynamic polarization control using plasma photonics[J]. Physical Review Letters, 116, 205001(2016).