Acta Optica Sinica, Volume. 45, Issue 1, 0112008(2025)
Full-Field Measurement Method for Wave Plate Based on Polarization Sensitive Digital Speckle Pattern Interferometry
Fig. 4. Original speckle images acquired by CCD at different polarization angles. (a) 0°; (b) 15°; (c) 30°; (d) 45°; (e) 60°; (f) 75°; (g) 90°; (h) 105°; (i) 120°; (j) 135°; (k) 150°; (l) 165°
Fig. 6. Interference of object and reference light. (a) Object light is elliptically polarized; (b) object light is circularlly polarized; (c) object light is horizontally polarized; (d) object light is vertically polarized
Fig. 10. Measurement results of phase retardation. (a) Wave-filtered; (b) area unwrapping; (c) displayed in 3D
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Guangxin Gao, Haisha Niu, Sijin Wu, Cuifang Kuang, Zhaizi Xie. Full-Field Measurement Method for Wave Plate Based on Polarization Sensitive Digital Speckle Pattern Interferometry[J]. Acta Optica Sinica, 2025, 45(1): 0112008
Category: Instrumentation, Measurement and Metrology
Received: Sep. 5, 2024
Accepted: Oct. 14, 2024
Published Online: Jan. 23, 2025
The Author Email: Niu Haisha (niuhs@buaa.edu.cn)
CSTR:32393.14.AOS241523