Semiconductor Optoelectronics, Volume. 45, Issue 2, 206(2024)
Algorithms to Reduce Noise in CCD Using Line Overscan Data
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MA Yuanyuan, LI Yandong, TANG Zunlie, LI Jin, ZHANG Na, LING Maozhen, HE Bin. Algorithms to Reduce Noise in CCD Using Line Overscan Data[J]. Semiconductor Optoelectronics, 2024, 45(2): 206
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Received: Dec. 17, 2023
Accepted: --
Published Online: Aug. 14, 2024
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