Semiconductor Optoelectronics, Volume. 45, Issue 2, 206(2024)
Algorithms to Reduce Noise in CCD Using Line Overscan Data
Figures & Tables(0)
Tools
Get Citation
Copy Citation Text
MA Yuanyuan, LI Yandong, TANG Zunlie, LI Jin, ZHANG Na, LING Maozhen, HE Bin. Algorithms to Reduce Noise in CCD Using Line Overscan Data[J]. Semiconductor Optoelectronics, 2024, 45(2): 206
Paper Information
Category:
Received: Dec. 17, 2023
Accepted: --
Published Online: Aug. 14, 2024
The Author Email:
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20