Semiconductor Optoelectronics, Volume. 45, Issue 2, 206(2024)

Algorithms to Reduce Noise in CCD Using Line Overscan Data

MA Yuanyuan, LI Yandong, TANG Zunlie, LI Jin, ZHANG Na, LING Maozhen, and HE Bin
Author Affiliations
  • [in Chinese]
  • show less

    This paper presents a correction algorithm based on line overscan data to solve the testing error produced by drifting image data in a full-frame transfer large-array chargecoupled device (CCD) and the noise introduced by the testing circuit, which prevent the accurate evaluation of the parameters of a CCD device. The effective image data and vertical overscan data were output simultaneously. The drifting image data were suppressed by subtracting the mean value of the vertical overscan data from the image data. In the testing circuit, the analog and digital modules simultaneously acted on a single line of the image data and vertical overscan data.The noise introduced by the testing circuit was eliminated by subtracting the mean value of the vertical overscan data from the image data. Experimental results showed that the proposed algorithm reduced the readout noise of the device by 20%. The ratio for values greater than 15eand 25e- in a dark difference image was reduced by 25%. The algorithm is suitable for a largearea-array CCD device and can correct the errors introduced by the testing circuit to improve the testing efficiency of a full-frame transfer large-area-array CCD device.件测试技术开发。

    Tools

    Get Citation

    Copy Citation Text

    MA Yuanyuan, LI Yandong, TANG Zunlie, LI Jin, ZHANG Na, LING Maozhen, HE Bin. Algorithms to Reduce Noise in CCD Using Line Overscan Data[J]. Semiconductor Optoelectronics, 2024, 45(2): 206

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Dec. 17, 2023

    Accepted: --

    Published Online: Aug. 14, 2024

    The Author Email:

    DOI:10.16818/j.issn1001-5868.2023121702

    Topics