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Chinese Optics Letters, Volume. 14, Issue 9, 093401(2016)

Full-field x ray nano-imaging system designed and constructed at SSRF

Binggang Feng1,2, Biao Deng1,2、*, Yuqi Ren1, Yudan Wang1, Guohao Du1, Hai Tan1,2, Yanling Xue1, and Tiqiao Xiao1,2
Author Affiliations
  • 1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    Article index updated: Feb. 24, 2023

    Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
    The article is cited by 9 article(s) from Web of Science.
    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
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    Binggang Feng, Biao Deng, Yuqi Ren, Yudan Wang, Guohao Du, Hai Tan, Yanling Xue, Tiqiao Xiao, "Full-field x ray nano-imaging system designed and constructed at SSRF," Chin. Opt. Lett. 14, 093401 (2016)

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    Paper Information

    Category: X-ray Optics

    Received: Jun. 5, 2016

    Accepted: Jul. 19, 2016

    Published Online: Aug. 3, 2018

    The Author Email: Biao Deng (dengbiao@sinap.ac.cn)

    DOI:10.3788/COL201614.093401

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology