Opto-Electronic Engineering, Volume. 30, Issue 3, 62(2003)

An Inversion Analysis Method Based on Multi-Shift Imaging for Improvement of CCD Imaging Resolution

[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Inversion Analysis Method Based on Multi-Shift Imaging for Improvement of CCD Imaging Resolution[J]. Opto-Electronic Engineering, 2003, 30(3): 62

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    Paper Information

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    Received: Apr. 3, 2002

    Accepted: --

    Published Online: Nov. 14, 2007

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