Opto-Electronic Engineering, Volume. 30, Issue 3, 62(2003)
An Inversion Analysis Method Based on Multi-Shift Imaging for Improvement of CCD Imaging Resolution
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Inversion Analysis Method Based on Multi-Shift Imaging for Improvement of CCD Imaging Resolution[J]. Opto-Electronic Engineering, 2003, 30(3): 62