Sub-Terahertz Measurement of Dielectric Properties Using Coplanar Waveguide

Ji Xu; Jiangtao Su; Laijun Liu; Jie Wang; Yongning He; Yongdong Li; Linghang Wang; Dawei Wang

doi:10.3788/CJL201946.0614037

Chinese Journal of Lasers, Volume. 46, Issue 6, 0614037(2019)

Sub-Terahertz Measurement of Dielectric Properties Using Coplanar Waveguide

Ji Xu^1,2, Jiangtao Su^、**, Laijun Liu^、***, Jie Wang¹, Yongning He⁴, Yongdong Li⁵, Linghang Wang⁶, and Dawei Wang^、*

Author Affiliations

¹ Ministry of Education Key Lab of RF Circuits and System, HangZhou DianZi University,Hangzhou, Zhejiang 310018, China

² School of Microelectronics and State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China

⁴ School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China

⁵ Key Lab for Physical Electronics and Devices of the Ministry of Education, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China

⁶ Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China;

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Ji Xu, Jiangtao Su, Laijun Liu, Jie Wang, Yongning He, Yongdong Li, Linghang Wang, Dawei Wang. Sub-Terahertz Measurement of Dielectric Properties Using Coplanar Waveguide[J]. Chinese Journal of Lasers, 2019, 46(6): 0614037

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Paper Information

Category: terahertz technology

Received: Jan. 14, 2019

Accepted: Apr. 8, 2019

Published Online: Jun. 14, 2019

The Author Email: Su Jiangtao (jtsu@hdu.edu.cn), Liu Laijun (ljliu2@163.com), Wang Dawei (dawei.wang@mail.xjtu.edu.cn)

DOI:10.3788/CJL201946.0614037

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology