Opto-Electronic Engineering, Volume. 31, Issue 1, 29(2004)

Phase-shifting interferometry to the flatness of a compact disk

[in Chinese]1,2, [in Chinese]2, and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(4)

    [2] [2] MALACARA D. Optical Shop Testing [M]. New York:John Wiley and Sons, 1992.

    [3] [3] CHENG Y Y,WYANT J C. Two-wavelength phase shifting interferometer [J]. Appl. Opt,1984, 23(23): 4539-4543.

    [7] [7] SWANTNER W H, LOWERY W H. Zernike-Tatian polynomials for interferogram reduction [J]. Appl.Opt ,1980, 19(1): 161-163.

    [8] [8] MAHAJIAN V N. Zernike annular polynomials for imaging systems with annular pupils [J]. JOSA,1981, 71(1): 75-85.

    CLP Journals

    [1] TAO Jia-yuan, WANG Ke-yi, LUO Guo-xiong. Intersection measurement for field tests[J]. Optics and Precision Engineering, 2015, 23(8): 2369

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    [in Chinese], [in Chinese], [in Chinese]. Phase-shifting interferometry to the flatness of a compact disk[J]. Opto-Electronic Engineering, 2004, 31(1): 29

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    Paper Information

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    Received: Oct. 16, 2003

    Accepted: --

    Published Online: Nov. 14, 2007

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