Opto-Electronic Engineering, Volume. 31, Issue 1, 29(2004)

Phase-shifting interferometry to the flatness of a compact disk

[in Chinese]1,2, [in Chinese]2, and [in Chinese]2
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    [in Chinese], [in Chinese], [in Chinese]. Phase-shifting interferometry to the flatness of a compact disk[J]. Opto-Electronic Engineering, 2004, 31(1): 29

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    Received: Oct. 16, 2003

    Accepted: --

    Published Online: Nov. 14, 2007

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