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Laser Technology, Volume. 47, Issue 4, 480(2023)

Investigation on infrared laser-induced damage process of GaAs wafers based on scattering signal

JIA Zhichao1、*, LI Xinhua1, LI Zewen2, and NI Xiaowu2
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    JIA Zhichao, LI Xinhua, LI Zewen, NI Xiaowu. Investigation on infrared laser-induced damage process of GaAs wafers based on scattering signal[J]. Laser Technology, 2023, 47(4): 480

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    Paper Information

    Received: Jun. 24, 2022

    Accepted: --

    Published Online: Dec. 11, 2023

    The Author Email: JIA Zhichao (jiazhichaonjust@163.com)

    DOI:10.7510/jgjs.issn.1001-3806.2023.04.006

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology