Laser & Optoelectronics Progress, Volume. 52, Issue 2, 21801(2015)
Effect of Aberration Induced by Refractive Index Mismatch on Imaging in Confocal Microscopy
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Xiao Yun, Zhang Yunhai, Tan Huiming. Effect of Aberration Induced by Refractive Index Mismatch on Imaging in Confocal Microscopy[J]. Laser & Optoelectronics Progress, 2015, 52(2): 21801
Category: Microscopy
Received: Aug. 10, 2014
Accepted: --
Published Online: Jan. 20, 2015
The Author Email: Xiao Yun (xiaoy@sibet.ac.cn)