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Laser & Optoelectronics Progress, Volume. 52, Issue 2, 21801(2015)

Effect of Aberration Induced by Refractive Index Mismatch on Imaging in Confocal Microscopy

Xiao Yun1,2,3、*, Zhang Yunhai1, and Tan Huiming1
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    Article index updated: Oct. 7, 2025

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    Xiao Yun, Zhang Yunhai, Tan Huiming. Effect of Aberration Induced by Refractive Index Mismatch on Imaging in Confocal Microscopy[J]. Laser & Optoelectronics Progress, 2015, 52(2): 21801

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    Paper Information

    Category: Microscopy

    Received: Aug. 10, 2014

    Accepted: --

    Published Online: Jan. 20, 2015

    The Author Email: Xiao Yun (xiaoy@sibet.ac.cn)

    DOI:10.3788/lop52.021801

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology