Ray-tracing method to analyze and quantify the light enhancement around subsurface defects in transparent materials

Rong Wu; Dongfeng Zhao; Lei Zhang; Ping Shao; Neng Hua; Zunqi Lin

doi:10.1117/12.2074559

Collection Of theses on high power laser and plasma physics, Volume. 12, Issue 1, 926609(2014)

Ray-tracing method to analyze and quantify the light enhancement around subsurface defects in transparent materials

Rong Wu^1、*, Dongfeng Zhao^1,2, Lei Zhang¹, Ping Shao¹, Neng Hua¹, and Zunqi Lin¹

Author Affiliations

¹Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Science, Shanghai 201800, China

²Graduate University of Chinese Academy of Science, Beijing 100049, China

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Rong Wu, Dongfeng Zhao, Lei Zhang, Ping Shao, Neng Hua, Zunqi Lin. Ray-tracing method to analyze and quantify the light enhancement around subsurface defects in transparent materials[J]. Collection Of theses on high power laser and plasma physics, 2014, 12(1): 926609

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Published Online: May. 27, 2017

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DOI:10.1117/12.2074559

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology