Surface Scattering and Imaging Characteristics of Rough Targets in Low-Frequency Terahertz Band

Xinyue Chai; Hao Hu; Xiaoxue Hu; Xinru Ma; Sixing Xi; Xiaolei Wang

doi:10.3788/LOP232282

Laser & Optoelectronics Progress, Volume. 61, Issue 10, 1011009(2024)

Surface Scattering and Imaging Characteristics of Rough Targets in Low-Frequency Terahertz Band

Xinyue Chai¹, Hao Hu¹, Xiaoxue Hu¹, Xinru Ma¹, Sixing Xi², and Xiaolei Wang^1、*

¹Institute of Modern Optics, College of Electronic Information and Optical Engineering, Nankai University, Tianjin 300350, China

²School of Mathematics and Physics Science and Engineering, Hebei University of Engineering, Handan 056038, Hebei, China

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Xinyue Chai, Hao Hu, Xiaoxue Hu, Xinru Ma, Sixing Xi, Xiaolei Wang. Surface Scattering and Imaging Characteristics of Rough Targets in Low-Frequency Terahertz Band[J]. Laser & Optoelectronics Progress, 2024, 61(10): 1011009

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Paper Information

Category: Imaging Systems

Received: Oct. 12, 2023

Accepted: Dec. 21, 2023

Published Online: May. 9, 2024

The Author Email: Xiaolei Wang (wangxiaolei@nankai.edu.cn)

DOI:10.3788/LOP232282

CSTR:32186.14.LOP232282

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology