Spectroscopy and Spectral Analysis, Volume. 35, Issue 3, 829(2015)
Contrast of Z-Pinch X-Ray Yield Measure Technique
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LI Mo, WANG Liang-ping, SHENG Liang, LU Yi. Contrast of Z-Pinch X-Ray Yield Measure Technique[J]. Spectroscopy and Spectral Analysis, 2015, 35(3): 829
Received: Oct. 21, 2013
Accepted: --
Published Online: May. 21, 2015
The Author Email: Mo LI (limo@nint.ac.cn)