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Spectroscopy and Spectral Analysis, Volume. 35, Issue 3, 829(2015)

Contrast of Z-Pinch X-Ray Yield Measure Technique

LI Mo*, WANG Liang-ping, SHENG Liang, and LU Yi
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    LI Mo, WANG Liang-ping, SHENG Liang, LU Yi. Contrast of Z-Pinch X-Ray Yield Measure Technique[J]. Spectroscopy and Spectral Analysis, 2015, 35(3): 829

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    Paper Information

    Received: Oct. 21, 2013

    Accepted: --

    Published Online: May. 21, 2015

    The Author Email: LI Mo (limo@nint.ac.cn)

    DOI:10.3964/j.issn.1000-0593(2015)03-0829-05

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology