Total Ionizing Dose Effects and Hardening Strategies of Typical Analog Circuits Based on Bipolar Process

Xiaofan ZHAO; Zhongfang WANG; Maodan Ma; Tao ZHANG; Hongyu DING; Yanguang LI; Yongheng YANG

doi:10.19328/j.cnki.2096-8655.2025.04.011

AEROSPACE SHANGHAI, Volume. 42, Issue 4, 97(2025)

Total Ionizing Dose Effects and Hardening Strategies of Typical Analog Circuits Based on Bipolar Process

Xiaofan ZHAO^1、*, Zhongfang WANG^1,2, Maodan Ma¹, Tao ZHANG¹, Hongyu DING¹, Yanguang LI¹, and Yongheng YANG¹

Author Affiliations

¹Guizhou Zhenhua Fenggua Semiconductor Co.，Ltd.，Guiyang550018，，China

²College of Information and Control Engineering，Xi'an University of Architecture and Technology，Xi’an710000，，China

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Xiaofan ZHAO, Zhongfang WANG, Maodan Ma, Tao ZHANG, Hongyu DING, Yanguang LI, Yongheng YANG. Total Ionizing Dose Effects and Hardening Strategies of Typical Analog Circuits Based on Bipolar Process[J]. AEROSPACE SHANGHAI, 2025, 42(4): 97

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Paper Information

Category: Space Radiation Effects

Received: Jun. 8, 2025

Accepted: --

Published Online: Sep. 29, 2025

The Author Email:

DOI:10.19328/j.cnki.2096-8655.2025.04.011

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology