AEROSPACE SHANGHAI, Volume. 42, Issue 4, 97(2025)

Total Ionizing Dose Effects and Hardening Strategies of Typical Analog Circuits Based on Bipolar Process

Xiaofan ZHAO1、*, Zhongfang WANG1,2, Maodan Ma1, Tao ZHANG1, Hongyu DING1, Yanguang LI1, and Yongheng YANG1
Author Affiliations
  • 1Guizhou Zhenhua Fenggua Semiconductor Co.,Ltd.,Guiyang550018,,China
  • 2College of Information and Control Engineering,Xi'an University of Architecture and Technology,Xi’an710000,,China
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    Figures & Tables(9)
    Typical bias circuits for the operational amplifiers and voltage reference
    Variations of the input bias current and input offset voltage of two operational amplifiers with the total ionizing dose
    Schematic diagrams of the input structure of general-purpose operational amplifier,input structure of precision operational amplifier, and base current compensation circuit
    Circuit diagrams of the basic current mirror and Wilson current mirror
    Variation of the static current of the operational amplifier with the total ionization dose
    Principle of the voltage reference
    Relationships between the reference output voltage,static current and the total ionizing dose
    • Table 1. Information of three chips

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      Table 1. Information of three chips

      序号器件 类型样品 名称样品 数量流片 工艺封装 形式
      1模拟集成 电路精密运算放大器7只40 V双极工艺8引线陶瓷小外形封装
      2通用运算放大器7只
      3电压基准7只
    • Table 2. <bold>Current replication accuracy of different current mirrors after the current gain of the transistor is attenuated</bold>

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      Table 2. <bold>Current replication accuracy of different current mirrors after the current gain of the transistor is attenuated</bold>

      电流镜类型150倍晶体管电流增益β100倍晶体管电流增益β30倍晶体管电流增益β15倍晶体管电流增益β
      普通电流镜电流复制精度98.6898.0493.7588.24
      威尔逊电流镜电流复制精度99.9999.9899.7999.22
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    Xiaofan ZHAO, Zhongfang WANG, Maodan Ma, Tao ZHANG, Hongyu DING, Yanguang LI, Yongheng YANG. Total Ionizing Dose Effects and Hardening Strategies of Typical Analog Circuits Based on Bipolar Process[J]. AEROSPACE SHANGHAI, 2025, 42(4): 97

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    Paper Information

    Category: Space Radiation Effects

    Received: Jun. 8, 2025

    Accepted: --

    Published Online: Sep. 29, 2025

    The Author Email:

    DOI:10.19328/j.cnki.2096-8655.2025.04.011

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