AEROSPACE SHANGHAI, Volume. 42, Issue 4, 97(2025)

Total Ionizing Dose Effects and Hardening Strategies of Typical Analog Circuits Based on Bipolar Process

Xiaofan ZHAO1、*, Zhongfang WANG1,2, Maodan Ma1, Tao ZHANG1, Hongyu DING1, Yanguang LI1, and Yongheng YANG1
Author Affiliations
  • 1Guizhou Zhenhua Fenggua Semiconductor Co.,Ltd.,Guiyang550018,,China
  • 2College of Information and Control Engineering,Xi'an University of Architecture and Technology,Xi’an710000,,China
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    This article focuses on the ionizing total dose effects of the analog integrated circuits in space radiation environments and the corresponding hardening strategies based on the standard bipolar process.The irreplaceable core role of analog circuits in spacecraft is discussed,the physical mechanisms of the ionizing total dose effects and their degeneration mechanisms on bipolar circuits are analyzed,and the necessity of hardening design is emphasized.The circuit hardening methods are elaborated in detail.Taking the operational amplifiers and voltage reference as examples,the degradation mechanisms of the total ionizing dose effects and the key points of the hardening design are specifically analyzed.The results show that,without designed hardening,the operational amplifiers based on the standard bipolar process will experience serious parameter deviations under the total ionizing dose of 30 krad(Si) (1 rad = 0.01 J/kg).Conducting circuit hardening design for sensitive parameters can enhance the space radiation tolerance of bipolar analog circuits,which is of great significance for ensuring the long-term reliable operation of spacecraft.

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    Xiaofan ZHAO, Zhongfang WANG, Maodan Ma, Tao ZHANG, Hongyu DING, Yanguang LI, Yongheng YANG. Total Ionizing Dose Effects and Hardening Strategies of Typical Analog Circuits Based on Bipolar Process[J]. AEROSPACE SHANGHAI, 2025, 42(4): 97

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    Paper Information

    Category: Space Radiation Effects

    Received: Jun. 8, 2025

    Accepted: --

    Published Online: Sep. 29, 2025

    The Author Email:

    DOI:10.19328/j.cnki.2096-8655.2025.04.011

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