Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry

MEI Yan; MA Mi-xia; NIE Zuo-ren

doi:10.3964/j.issn.1000-0593(2013)12-3408-03

Spectroscopy and Spectral Analysis, Volume. 33, Issue 12, 3408(2013)

Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry

MEI Yan^1、*, MA Mi-xia², and NIE Zuo-ren¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

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References(5)

[1] [1] Funahashi M, Kuraoka M, Fujimura S, et al. Advance in X-ray Analysis, 2000, 43: 109.

[2] [2] Parekh N S, Nieuwenhuizen C, Borstrok J J M, et al. Electrochem. Soc., 1991, 138: 1460.

[4] [4] Artz B E, Bomback J L. X-ray Spectrometry, 1982, 11: 51.

[5] [5] Lyman P F, Sakat a O, Marasco D L, et al. Surf. Sci., 2000, 462: L594.

[6] [6] Pootrmans J, Archipov V. Thin Film Solar Cells. New York, USA: John Wiley Sons, 2006. 142.

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MEI Yan, MA Mi-xia, NIE Zuo-ren. Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry[J]. Spectroscopy and Spectral Analysis, 2013, 33(12): 3408

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Paper Information

Received: Jan. 19, 2013

Accepted: --

Published Online: Jan. 9, 2014

The Author Email: MEI Yan (meiyan@bjut.edu.cn)

DOI:10.3964/j.issn.1000-0593(2013)12-3408-03

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology