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Spectroscopy and Spectral Analysis, Volume. 33, Issue 12, 3408(2013)

Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry

MEI Yan1、*, MA Mi-xia2, and NIE Zuo-ren1
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    MEI Yan, MA Mi-xia, NIE Zuo-ren. Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry[J]. Spectroscopy and Spectral Analysis, 2013, 33(12): 3408

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    Paper Information

    Received: Jan. 19, 2013

    Accepted: --

    Published Online: Jan. 9, 2014

    The Author Email: MEI Yan (meiyan@bjut.edu.cn)

    DOI:10.3964/j.issn.1000-0593(2013)12-3408-03

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology