S-parameters Measurement of Semiconductor Microwave Devices by Ultrashort Optical Pulses

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Chinese Journal of Lasers, Volume. 25, Issue 6, 495(1998)

[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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References(3)

[1] [1] M. Matloubian, H. Fetterman. Picosecond optoelectronic measurement of S paramenters and optical recponse of an AlGaAs/GaAs HBT. IEEE Trans. Microwave Theory Tech., 1990, 38(5): 683～686

[3] [3] Jiang Huanwen, Sun Xu. Electron Measure. Beijing: Chinese Measure Press, 1988, 362～365 (in Chinese)

[4] [4] Su Shenghe. Modern Time-domain Measure. Harbin: Harbin Industry University Press, 1989, 253～255 (in Chinese)

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. S-parameters Measurement of Semiconductor Microwave Devices by Ultrashort Optical Pulses[J]. Chinese Journal of Lasers, 1998, 25(6): 495

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Paper Information

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Received: Jan. 3, 1997

Accepted: --

Published Online: Oct. 18, 2006

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Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology