Chinese Journal of Lasers, Volume. 25, Issue 6, 495(1998)
S-parameters Measurement of Semiconductor Microwave Devices by Ultrashort Optical Pulses
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. S-parameters Measurement of Semiconductor Microwave Devices by Ultrashort Optical Pulses[J]. Chinese Journal of Lasers, 1998, 25(6): 495
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