Chinese Journal of Lasers, Volume. 25, Issue 6, 495(1998)
S-parameters Measurement of Semiconductor Microwave Devices by Ultrashort Optical Pulses
The principle to measure S-parameters of microwave devices with ultrashort optical pulses has been described. The measuring system with a maximum frequency up to 100 GHz has been developed. We have measured the devices with a frequency of 36 GHz. The results agree well with those measured by using a network analyzer.
Keywords
Tools
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. S-parameters Measurement of Semiconductor Microwave Devices by Ultrashort Optical Pulses[J]. Chinese Journal of Lasers, 1998, 25(6): 495
Paper Information
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20